John Rodenburg
John Marius Rodenburg FRS[3] is Professor in the Department of Electronic and Electrical Engineering at the University of Sheffield.[4][5]
John Rodenburg | |
---|---|
Born | John Marius Rodenburg 1960 (age 60–61)[1] |
Alma mater | University of Exeter (BSc) University of Cambridge (PhD) |
Awards | Royal Society University Research Fellowship |
Scientific career | |
Fields | Microscopy Materials analysis[2] |
Institutions | University of Sheffield Sheffield Hallam University Phase Focus Limited[1] Murray Edwards College, Cambridge |
Thesis | Detection and interpretation of electron microdiffraction patterns (1986) |
Website | www |
Education
Rodenburg was educated at University of Exeter where he was awarded a Bachelor of Science degree in Physics with Electronics. He moved to the Cavendish Laboratory[6] to complete his PhD on the detection and interpretation of electron diffraction patterns which was awarded by the University of Cambridge in 1986.[7]
Career and research
Rodenburg's research interests are in microscopy, materials analysis and the use of ptychography and algorithms for phase retrieval.[2][8][9][10][11] He co-founded Phase Focus Limited and served as its director and Chief Scientific Officer from 2006 to 2015.[12]
Awards and honours
Rodenburg was elected a Fellow of the Royal Society (FRS) in 2019 for "substantial contributions to the improvement of natural knowledge".[13]
References
- Anon (2006). "John Marius Rodenburg". companieshouse.gov.uk. London: Companies House. Archived from the original on 2019-11-07.
- John Rodenburg publications indexed by Google Scholar
- Anon (2019). "Professor John Rodenburg FRS". royalsociety.org. London: Royal Society. Archived from the original on 2019-04-24. One or more of the preceding sentences incorporates text from the royalsociety.org website where:
“All text published under the heading 'Biography' on Fellow profile pages is available under Creative Commons Attribution 4.0 International License.” --Royal Society Terms, conditions and policies at the Wayback Machine (archived 2016-11-11)
- Sheffield, University of. "Professor John Rodenburg - Academics - Staff - EEE - The University of Sheffield". www.sheffield.ac.uk.
- Sheffield, University of. "University of Sheffield engineer awarded one of academia's greatest honours - Latest - News - The University of Sheffield". www.sheffield.ac.uk.
- Howie, A.; McGill, C. A.; Rodenburg, J. M. (1985). "Intensity Correlations in Microdiffraction from "Amorphous" Materials". Le Journal de Physique Colloques. 46 (C9): C9-59–C9-62. doi:10.1051/jphyscol:1985906. ISSN 0449-1947.
- Rodenburg, John Marius (1986). Detection and interpretation of electron microdiffraction patterns. jisc.ac.uk (PhD thesis). University of Cambridge. OCLC 59723869. EThOS uk.bl.ethos.377238.
- Maiden, Andrew M.; Rodenburg, John M. (2009). "An improved ptychographical phase retrieval algorithm for diffractive imaging". Ultramicroscopy. 109 (10): 1256–1262. doi:10.1016/j.ultramic.2009.05.012. ISSN 0304-3991. PMID 19541420.
- Rodenburg, J. M.; Hurst, A. C.; Cullis, A. G.; Dobson, B. R.; Pfeiffer, F.; Bunk, O.; David, C.; Jefimovs, K.; Johnson, I. (2007). "Hard-X-Ray Lensless Imaging of Extended Objects". Physical Review Letters. 98 (3): 034801. doi:10.1103/PhysRevLett.98.034801. ISSN 0031-9007. PMID 17358687.
- Faulkner, H. M. L.; Rodenburg, J. M. (2004). "Movable Aperture Lensless Transmission Microscopy: A Novel Phase Retrieval Algorithm". Physical Review Letters. 93 (2): 023903. doi:10.1103/PhysRevLett.93.023903. ISSN 0031-9007. PMID 15323918.
- Rodenburg, J. M.; Faulkner, H. M. L. (2004). "A phase retrieval algorithm for shifting illumination". Applied Physics Letters. 85 (20): 4795–4797. doi:10.1063/1.1823034. ISSN 0003-6951.
- "Live Cell Imaging: Automated Cell Tracking and Analysis: Phasefocus Ptychography". www.phasefocus.com.
- Anon (2015). "Royal Society Elections". London: Royal Society. Archived from the original on 2015-09-06.